On January 16, 2026, the “Joint Laboratory for Reliability Evaluation Methods and Lifetime Prediction of Power Devices”, co-established by the Institute of Energy, Hefei Comprehensive National Science Center and Jiangsu Macmic Science & Technology Co., Ltd., held a project progress meeting. The meeting successfully completed the closure of Phase I and the approval of Phase II. Both parties affirmed the systematic cooperation achievements since the establishment of the Joint Laboratory and unanimously agreed to further deepen collaborative research on core technologies of high-voltage power devices by relying on this platform.

At the meeting, Professor Deng Erping, Director of the Joint Laboratory and project leader, delivered a summary report on the Phase I project “On-line Junction Temperature Monitoring Technology for High-Voltage Devices in HTRB Testing”. He also introduced the implementation plan and expected goals of the Phase II project. Xing Hui, Deputy Director of the Center for Intelligent Power, and Cui Song, Deputy General Manager of Macmic Science & Technology, signed the Phase II project agreement of the Joint Laboratory.

The meeting also commended and awarded outstanding members of the Joint Laboratory. Deputy Director Xing Hui and Deputy General Manager Cui Song jointly presented honorary certificates to the technical personnel who made outstanding contributions in the Phase I project, affirming their innovative achievements and dedicated efforts in the R&D of high-voltage device junction temperature monitoring technology, and encouraging the team to devote themselves to subsequent research with greater enthusiasm.

The convening of this meeting marks that the Joint Laboratory has established a coherent and in-depth project layout in the field of power device reliability research, laying a solid foundation for subsequent technological breakthroughs and industrial cooperation.